Method of detecting an analyte in a sample using semiconductor nanocrystals as a detectable label
AssigneeQuantum Dot Corporation
InventorsMarcel P. Bruchez, R. Hugh Daniels, Stephen A. Empedocles, Vince E. Phillips, Edith Y. Wong, Donald A. Zehnder
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Abstract
The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a distinct wavelength.
Claims45
A method of detecting one or more target analytes in a sample containing or suspected of containing the one or more analytes, comprising the steps of:
- (a) providing the sample on a solid support;
- (b) combining said sample with a semiconductor nanocrystal conjugate, wherein said combining is performed under conditions that allow formation of a complex comprising said conjugate and said analyte, when present;
- (c) removing any unbound conjugate;
- (d) detecting the presence of the complex, if present, by monitoring a spectral emission mediated by the semiconductor nanocrystal in the complex, wherein the emission indicates the presence of one or more target analytes in the sample.
A method of detecting one or more target analytes in a sample containing or suspected of containing the one or more analytes, comprising the steps of:
- (a) providing an unlabeled specific-binding molecule on a solid support;
- (b) combining said sample with said specific-binding molecule, wherein said combining is performed under conditions that allow formation of a first complex comprising said specific-binding molecule and said analyte, when present;
- (c) removing any unbound sample;
- (d) combining said first complex with a semiconductor nanocrystal conjugate, wherein said combining is performed under conditions that allow formation of a second complex comprising said conjugate and said analyte, when present;
- (e) removing any unbound conjugate;
- (f) detecting the presence of the second complex, if present, by monitoring a spectral emission mediated by the semiconductor nanocrystal in the second complex, wherein the emission indicates the presence of one or more target analytes in the sample.
A method of detecting one or more target analytes in a sample containing or suspected of containing the one or more analytes, comprising the steps of:
- (a) providing the sample on a solid support;
- (b) combining with said sample a specific-binding molecule, wherein (i) said specific-binding molecule comprises a first member of a binding pair, and (ii) said combining is performed under conditions that allow formation of a first complex comprising said specific-binding molecule and said analyte, when present;
- (c) removing any unbound specific-binding molecule;
- (d) combining said first complex with a second member of the binding pair, wherein (i) said second member of the binding pair is linked to a first semiconductor nanocrystal;
- and (ii) said combining is performed under conditions that allow formation of a second complex comprising the binding pair and said one or more analytes;
- and
- (e) detecting the presence of the second complex, if present, by monitoring a spectral emission mediated by the first semiconductor nanocrystal in the second complex, wherein the emission indicates the presence of one or more target analytes in the sample.
A method of detecting one or more target analytes in a sample containing or suspected of containing the one or more analytes, comprising the steps of:
- (a) providing a first complex comprising at least one specific-binding molecule to which is bound a semiconductor nanocrystal conjugate, wherein said semiconductor nanocrystal has a characteristic spectral emission and wherein said conjugate specifically binds to said specific-binding molecule;
- (b) combining said sample with said first complex, wherein said combining is performed under conditions that allow formation of a second complex comprising said specific-binding molecule and said analyte, when present;
- (c) detecting the presence of the second complex, if present, by monitoring the characteristic spectral emission of the semiconductor nanocrystal, wherein a change in the characteristic spectral emission indicates the presence of one or more target analytes in the sample.
Dependencies are inferred from the claim text.