Method and system of testing data retention of memory
AssigneeLSI Logic Corporation
InventorsCharutosh Dixit, William Shen
Life of this patent
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AssigneeLSI Logic Corporation
InventorsCharutosh Dixit, William Shen
Estimating the term…
A method and system of testing data retention of memory is provided. An embodiment of the method of testing data retention of memory comprises: writing first data to a first memory sub-group during a first time period; writing second data to a second memory sub-group during a second time period subsequent to said first time period; pausing for a predetermined time interval during a third time period subsequent to said second time period; reading a first one of said first and second data during a fourth time period subsequent to said third time period; reading a second one of said first and second data during a fifth time period subsequent to said fourth time period; and comparing said first and second ones of read data to expected results to determine data retention capabilities of said first and second memory sub-groups.
A method of testing data retention of memory;
A system for testing data retention of memory, comprising:
An system for testing data retention of memory, comprising:
Dependencies are inferred from the claim text.