Apparatus for non-destructive measurement of the thickness of thin layers
AssigneeImmobiliengesellschaft Helmut Fischer GmbH & Co. KG
InventorsHelmut Fischer, Bernhard Scherzinger
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Abstract
An apparatus for non-destructive measurement of the thickness of thin layers, has a housing and a probe which is connected to an evaluation unit and to which signals are emitted during a measurement for determining the layer thickness, and having a display apparatus which indicates at least the measurement data from the evaluation unit. At least one further display apparatus is positioned on the housing away from the plane of the first display apparatus.
Claims11
Apparatus for non-destructive measurement of the thickness of thin layers, having a housing and having a probe which is connected to an evaluation unit and to which signals are emitted during a measurement for determining the layer thickness, and having a display apparatus which indicates at least the measurement data from the evaluation unit, characterized in that at least one further display apparatus is provided and positioned on the housing away from a plane of the first display apparatus.
Dependencies are inferred from the claim text.