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US 2004/0165191 A1Published application
Interference measuring probe
AssigneeRobert Bosch GmbH
InventorsDominique Breider, Marc-Henri Duvoisin, Dominique Marchal, Vincent Thominet
Life of this patent
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Abstract
A method and a device for measuring at least one test surface and a reference test surface having an interference measuring probe which emits a first measuring beam which is aligned with respect to the reference test surface, are described. The measuring probe emits at least one second measuring beam, which is aligned with respect to at least the at least one test surface.
Claims17
A method for measuring at least one test surface and a reference test surface, comprising:
- causing an interference measuring probe to emit a first measuring beam aligned with respect to the reference test surface;
- emitting at least one second measuring beam that is aligned with respect to at least the at least one test surface.
A device for measuring at least one test surface and a reference test surface, comprising:
- an interference measuring probe that emits a first measuring beam aligned with respect to the reference test surface, wherein:
- the interference measuring probe emits at least one second measuring beam aligned with respect to at least the at least one test surface.
Dependencies are inferred from the claim text.