Exposure apparatus and production method of device using the same
AssigneeNikon Corporation
InventorSaburo Kamiya
Life of this patent
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Abstract
An exposure apparatus which transfers a pattern image formed on a mask on to a substrate through a projection optical system, comprising a substrate table which holds said substrate, a first sensor which measures a gap between said substrate surface held by said substrate table and a control target position, and a second sensor which measures a distance between said projection optical system and said substrate table in an optical axis direction and corrects the control target position of said first sensor.
Claims1
An exposure apparatus which transfers a pattern image formed on a mask on to a substrate through a projection optical system, comprising:
- a substrate table which holds said substrate;
- a first sensor which measures a gap between said substrate surface held by said substrate table and a control target position;
- and
- a second sensor which measures a distance between said projection optical system and said substrate table in an optical axis direction and corrects the control target position of said first sensor.
Dependencies are inferred from the claim text.