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US 2004/0164763 A1Published application
Semiconductor device with impedance calibration function
AssigneeAtlab Inc.
InventorsYang Gyun Kim, Seung Beom Baik, Young Ho Shin
Life of this patent
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Abstract
Disclosed is a semiconductor device comprising a reference circuit for receiving a plurality of impedance control signals and generating a reference voltage, a transmission driving circuit for receiving the impedance control signals and a pair of differential input signals and outputting a pair of differential output signals to an external cable, and an impedance control signal generating circuit for receiving a difference signal of the differential output signals and the reference voltage and generating the impedance control signals.
Claims13
A semiconductor device comprising:
- a reference circuit for receiving a plurality of impedance control signals and generating a reference voltage;
- a transmission driving circuit for receiving the impedance control signals and a pair of differential input signals and outputting a pair of differential output signals to an external cable;
- and
- an impedance control signal generating circuit for receiving a difference signal of the differential output signals and the reference voltage and generating the impedance control signals.
1 more element
Dependencies are inferred from the claim text.