Probe based information storage for probes used for opens detection in in-circuit testing
AssigneeAgilent Technologies, Inc.
InventorsDavid T. Crook, Curtis A. Tesdahl
Life of this patent
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Abstract
Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
Claims19
An electrical probe couplable to a measuring device, comprising:
- a probe sensing interface operable to sense at least one signal on at least one node under test;
- a signal channel for transmitting said sensed at least one signal;
- a memory for storing probe-specific information;
- a processor operatively coupled to said memory for retrieving said probe-specific information;
- and
- a communications interface operable to send said probe-specific information to said measuring device.
A capacitive coupling probe, comprising:
- a signal channel;
- a capacitive plate coupled to said signal channel;
- a memory for storing probe-specific information;
- a processor operatively coupled to said memory for retrieving said probe-specific information;
- and
- a communications interface operable to send said probe-specific information to said measuring device.
A method for obtaining probe-specific information from an electrical probe, said probe comprising a processor coupled to a memory which stores said probe-specific information and is responsive to a request for said probe-specific information from a requesting device by retrieving said probe-specific information from said memory and sending said retrieved probe-specific information to said requesting device, said method comprising:
- requesting said probe-specific information from said probe;
- and
- receiving said probe-specific information retrieved by said processor.
A method executing within an electrical probe, said probe comprising a processor coupled to a memory which stores probe-specific information, said method comprising:
- retrieving said probe-specific information from said memory;
- and
- sending said probe-specific information to an external device.
A method executing within an electrical probe, said probe comprising a processor coupled to a memory, said method comprising:
- receiving probe-specific information from an external device;
- and
- storing said probe-specific information in said memory.
Dependencies are inferred from the claim text.