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US 2004/0150815 A1Published application
Flaw detection in objects and surfaces
AssigneeApplied Vision Company, LLC
InventorsRichard Allen Sones, Amir Reza Novini
Life of this patent
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Abstract
The invention relates generally to the simultaneous acquisition of superimposed color dark-field and light-field images with a camera followed by decoupling of the images into monochrome components for further analysis of surface defects.
Claims52
A machine vision inspection method comprising the steps of:
- (a) illuminating an area to be inspected with a first illuminator by emitting light of a first color, said first illuminator providing light-field illumination of said area;
- (b) illuminating said area with a second illuminator emitting light of a second color, said second illuminator providing dark-field illumination of said area, said first and second color light being of different bands of wavelengths;
- (c) acquiring a color image of said area while said area is illuminated with both said first and said second illuminators;
- (d) processing data within said color image to detect flaws in said area.
1 more element
A machine vision inspection method comprising the steps of:
- (a) illuminating an area to be inspected with a first illuminator by emitting light of at least a first color, said first illuminator providing light-field illumination of said area;
- (b) illuminating said area with a second illuminator emitting light of at least a second color, said second illuminator providing dark-field illumination of said area, said first and second color light being of different bands of wavelengths;
- (c) acquiring a color image of said area while said area is illuminated with both said first and said second illuminators;
- (d) processing data within said color image to detect flaws in said area.
1 more element
A machine vision inspection method comprising the steps of:
- (a) illuminating an area to be inspected with a first and second illuminator, said illuminators emitting a first and second color light of different bands of wavelengths;
- (b) acquiring a color image of said area while said area is illuminated with both said first and said second illuminators;
- (c) processing data within said color image to detect flaws in said area.
A machine vision inspection method comprising the steps of
- (a) illuminating an area to be inspected with at least three means for emitting light, each means of different bands of wavelengths;
- (b) acquiring a color image of said area while said area is illuminated;
- (c) processing data within said color image to detect flaws in said area.
An apparatus which comprises:
- (a) a first means for emitting light of a first color to provide light-field illumination of an area;
- (b) a second means for emitting light of a second color to provide dark-field illumination of said area, said first and second color light being of different bands of wavelengths;
- (c) a means for area-present detection which strobes said means for predetermined intervals;
- (d) a color image acquisition means for acquiring a color image of said area while said area is simultaneously illuminated;
- (e) a processing means for processing data within said color image to detect flaws in said area.
2 more elements
Dependencies are inferred from the claim text.