# US 2004/0150407 A1 · System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2004/0150407 A1 - Document ID: US20040150407A1 - Status: Published application - Kind: A1 - Application number: 10/445,876 - Filed: 2003-05-28 - Published: 2004-08-05 - Earliest claimed: 2003-01-31 - Assignees: YieldBoost Tech, Inc. - Inventors: Kyo Young Chung - Web page: https://patentgrep.com/patent/US20040150407A1 ## CPC - G02F 1/136259: {Repairing; Defects} - G02F 1/136254: {Checking; Testing} - G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS ## Abstract A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, and optimizing production yields is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user-defined parameters, such as profit. ## Claims ### Claim 1 A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising: determining if a process abnormality occurred during a manufacturing process for the electrode array panel; and adjusting the thresholding parameters based on the existence of a process abnormality during the manufacturing process. ### Claim 2 (depends on 1) The method of claim 1, wherein the thresholding parameters are adjusted based on how large an area of the electrode array panel is affected by the process abnormality. ### Claim 3 (depends on 2) The method of claim 2, wherein the thresholding parameters are tightened as the area of the electrode array panel affected by the process abnormality becomes larger. ### Claim 4 (depends on 1) The method of claim 1, wherein the process abnormality is detected by optically inspecting the electrode array panel after the manufacturing process. ### Claim 5 A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising: measuring the pixel voltages; identifying pixel voltages that deviate from a mean normal pixel voltage value; and adjusting the thresholding parameters based on the pixel voltages that deviate from the mean normal pixel voltage. ### Claim 6 (depends on 5) The method of claim 5, wherein the step of adjusting the thresholding parameters comprises: defining a region of the electrode array panel; identifying pixels in the defined region that exhibit pixel voltages that deviate from the mean normal pixel voltage; and tightening the thresholding parameters applied to the pixels in the defined region if the number of identified pixels exceeds a predetermined number. ### Claim 7 (depends on 6) The method of claim 6, wherein the defined region comprises a substantially linear region. ### Claim 8 A method of improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising: determining a probability that a defect is present in the electrode array panel; and adjusting the thresholding parameters based on the determined probability. ### Claim 9 (depends on 8) The method of claim 8, wherein the threshold parameters are tightened if the determined probability exceeds a predetermined value. ### Claim 10 (depends on 8) The method of claim 8, wherein the probability that a defect is present is determined based on whether a process abnormality occurred during a manufacturing process for the electrode array panel. ### Claim 11 (depends on 8) The method of claim 8, wherein the probability that a defect is present is determined by: defining a region of the electrode array panel; identifying pixels in the defined region that exhibit pixel voltages that deviate from the mean normal pixel voltage; and determining the probability based on the number of identified pixels. ### Claim 12 (depends on 11) The method of claim 11, wherein the threshold parameters for the pixels in the defined region are tightened if the number of identified pixels exceeds a predetermined number. ### Claim 13 An article of manufacture, comprising: a computer usable medium having computer readable program code embodied therein for improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the computer readable program code in the article of manufacture causing a computer to: determine a probability that a defect is present in the electrode array panel; and adjust the thresholding parameters based on the determined probability. ### Claim 14 (depends on 13) The article of manufacture of claim 13, wherein the computer readable program code causes a computer to tighten the threshold parameters if the determined probability exceeds a predetermined value. ### Claim 15 (depends on 13) The article of manufacture of claim 13, wherein the computer readable program code causes a computer to determine the probability that a defect is present based on whether a process abnormality occurred during a manufacturing process for the electrode array panel. ### Claim 16 (depends on 13) The article of manufacture of claim 13, wherein the computer readable program code causes a computer to determine the probability that a defect is present by: defining a region of the electrode array panel; identifying pixels in the defined region that exhibit pixel voltages that deviate from the mean normal pixel voltage; and determining the probability based on the number of identified pixels. ### Claim 17 (depends on 16) The article of manufacture of claim 16, wherein the computer readable program code causes a computer to tighten the threshold parameters for the pixels in the defined region if the number of identified pixels exceeds a predetermined number. ### Claim 18 A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for improving a defect detection efficiency of a test recipe used to evaluate electrode array panels, wherein the test recipe comprises pixel driving signals applied to the electrode array panels that generate pixel voltages, and thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising: determining a probability that a defect is present in the electrode array panel; and adjusting the thresholding parameters based on the determined probability. ### Claim 19 (depends on 18) The program storage device of claim 18, wherein the threshold parameters are tightened if the determined probability exceeds a predetermined value. ### Claim 20 (depends on 18) The program storage device of claim 18, wherein the probability that a defect is present is determined based on whether a process abnormality occurred during a manufacturing process for the electrode array panel. ### Claim 21 (depends on 18) The program storage device of claim 18, wherein the probability that a defect is present is determined by: defining a region of the electrode array panel; identifying pixels in the defined region that exhibit pixel voltages that deviate from the mean normal pixel voltage; and determining the probability based on the number of identified pixels. ### Claim 22 (depends on 21) The program storage device of claim 21, wherein the threshold parameters for the pixels in the defined region are tightened if the number of identified pixels exceeds a predetermined number. ### Claim 23 A defect detection system used to evaluate electrode array panels, wherein the system applies pixel driving signals applied to the electrode array panels that generate pixel voltages, and initial thresholding parameters applied to the pixel voltages to determine if a pixel is defective, the method comprising: an array test stage for applying pixel driving signals to the electrode array panels, and for measuring pixel voltages generated in response to the pixel driving signals, wherein the array test stage comprises a processor for: applying thresholding parameters to the pixel voltages to determine if a pixel is defective, identifying pixel voltages that deviate from a mean normal pixel voltage value, and adjusting initial thresholding parameters based on the pixel voltages that deviate from the mean normal pixel voltage. ### Claim 24 (depends on 23) The system of claim 23, wherein the processor adjusts the initial thresholding parameters by: defining a region of the electrode array panel; identifying pixels in the defined region that exhibit pixel voltages that deviate from the mean normal pixel voltage; applying tighter thresholding parameters than the initial thresholding parameters over the defined region if the number of identified pixels exceeds a predetermined number. ### Claim 25 (depends on 24) The system of claim 24, wherein the defined region comprises a substantially linear region.