A record medium stored with a process control program for a computer to execute the controlled manufacture of a composite oxide thin film wherein there are prepared a plurality of sputtering targets made of materials having atomic compositions of a like plurality of block, respectively, which constitute a basic unit cell of the composite oxide thin film, to form on a substrate respective block of said compositions successively by sputtering from said sputtering targets by turns in successive sputtering operations each controllably so that each of said block has a film thickness determined for the corresponding block in said basic unit cell, characterized in that said process control program comprises input data for respective sputtering power magnitudes for said sputtering targets, rate(s) of rotation and temperature(s) of said substrate, gas flow rate(s) and pressure(s), degree(s) of vacuum, respective rates of deposition of said block on said substrate from said target materials and respective time periods for deposition of said block on said substrate determined from the respective thicknesses of said block in said basic unit cell, and respective numbers of repetition of said sputtering operations needed corresponding to a desired thickness of said composite oxide thin film, and said input data are enterable into a computer to have the computer communicate with terminal computers associated, respectively, with a plurality of sputtering power supply units, a substrate holding, rotating and heating unit, shutters and their respective rotation control units, a gas flow rate and pressure control unit, and a plurality of evacuating units to control respective operations of these units.