Semiconductor device and method for testing the same
AssigneeSamsung Electronics Co., Ltd.
InventorJung-Hwan Choi
Life of this patent
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Abstract
Semiconductor devices with simultaneous bi-directional (SBD) data ports, test board configurations for such devices, and test methods for such devices, are disclosed. The devices have two SBD data ports with a pass mode that relays data between the ports. Significantly, each device contains configurable switching elements that allow a test mode, wherein unidirectional input/output data on one SBD data port is mapped to bi-directional data on the other SBD data port. This allows device testing with automated test equipment that employs unidirectional data signaling, and yet allows such test equipment to test the SBD capability of such devices.
Claims20
A method of testing a device configuration having an external data port and at least one internal data port, wherein each data port comprises multiple pads, and wherein the pads of the external and internal data ports support simultaneous bi-directional (SBD) data signaling, the method comprising:
- connecting the pads of the external data port to communicate with a tester using unidirectional data signaling;
- connecting at least one first internal data port pad to a second internal data port pad;
- and
- setting internal data paths in at least one device of the device configuration to concurrently
- route a first write signal received on a first external data port pad to an output driver of the first internal data port pad,
- route a second write signal received on a second external data port pad to an output driver of the second internal data port pad,
- route a signal received by a receiver of the first internal data port pad to a third external data port pad as a first read signal, and
- route a signal received by a receiver of the second internal data port pad to a fourth external data port pad as a second read signal.
A semiconductor device comprising:
- a first data port and a second data port, each data port comprising at least first and second pads each supporting simultaneous bi-directional (SBD) data transmission;
- a normal data path connecting the first data port with internal circuitry of the device;
- a pass-through path connecting the first data port with the second data port in a first correspondence of first-data-port pads to second-data-port pads;
- and
- a test path connecting the first data port with the second data port in a second correspondence of first-data-port to second-data-port pads;
- and
- path select circuitry to select between the pass-through path and the test path.
Dependencies are inferred from the claim text.