Method for predicting whether a failure of an electrical device may occur

A method of predicting whether a failure of an electrical device may occur if a receiver within the electrical device is subjected to a noise pulse, the receiver having a circuit type and a beta-ratio, the noise pulse having an amplitude and a width, the method comprising:

• a) locating an integrated circuit that drives the receiver, the integrated circuit that drives the receiver having a circuit type;
• b) locating an integrated circuit that is driven by the receiver, the integrated circuit that is driven by the receiver having a circuit type and a capacitance;
• c) selecting, based at least in part upon the circuit type of the receiver, a plurality of noise-tolerance curves;
• d) selecting, based at least in part upon the capacitance of the integrated circuit that is driven by the receiver, the circuit type of the integrated circuit driven by the receiver, and the beta-ratio of the receiver, one of the plurality of noise-tolerance curves;
• e) selecting a noise-propagation constant based at least in part upon the circuit type of the integrated circuit that drives the receiver;
• f) determining, based upon the noise-tolerance curve and the width of the noise pulse, a noise-tolerance;
• and
• g) comparing the noise-tolerance to the amplitude of the noise pulse.

A method of predicting whether a failure of an electrical device may occur if a receiver within the electrical device is subjected to a noise pulse, the receiver having a beta-ratio, the noise pulse having an amplitude and a width, the method comprising:

• a) locating an integrated circuit that drives the receiver;
• b) locating an integrated circuit that is driven by the receiver;
• c) selecting, based at least in part upon the beta-ratio of the receiver, a noise-tolerance curve;
• d) determining, based at least in part upon the noise-tolerance curve and the width of the noise pulse, a noise-tolerance;
• and
• e) comparing the noise-tolerance to the amplitude of the noise pulse.

A program storage device containing computer readable instructions, that when executed by a computer perform a method of predicting whether a failure of an electrical device may occur if a receiver within the electrical device is subjected to a noise pulse, the receiver having a circuit type and a beta-ratio, the noise pulse having an amplitude and a width, the method comprising:

• a) locating an integrated circuit that drives the receiver, the integrated circuit that drives the receiver having a circuit type;
• b) locating an integrated circuit that is driven by the receiver, the integrated circuit that is driven by the receiver having a circuit type and a capacitance;
• c) selecting, based at least in part upon the circuit type of the receiver, a plurality of noise-tolerance curves;
• d) selecting, based at least in part upon the capacitance of the integrated circuit that is driven by the receiver, the circuit type of the integrated circuit driven by the receiver, and the beta-ratio of the receiver, one of the plurality of noise-tolerance curves;
• e) selecting a noise-propagation constant based at least in part upon the circuit type of the integrated circuit that drives the receiver;
• f) determining, based upon the noise-tolerance curve and the width of the noise pulse, a noise-tolerance;
• and
• g) comparing the noise-tolerance to the amplitude of the noise pulse.

A method of fabricating an electrical device that contains a receiver, the receiver having a circuit type and a beta-ratio, the noise pulse having an amplitude and a width, the method comprising:

• a) locating an integrated circuit that drives the receiver, the integrated circuit that drives the receiver having a circuit type;
• b) locating an integrated circuit that is driven by the receiver, the integrated circuit that is driven by the receiver having a circuit type and a capacitance;
• c) selecting, based at least in part upon the circuit type of the receiver, a plurality of noise-tolerance curves;
• d) selecting, based at least in part upon the capacitance of the integrated circuit that is driven by the receiver, the circuit type of the integrated circuit driven by the receiver, and the beta-ratio of the receiver, one of the plurality of noise-tolerance curves;
• e) selecting a noise-propagation constant based at least in part upon the circuit type of the integrated circuit that drives the receiver;
• f) determining, based upon the noise-tolerance curve and the width of the noise pulse, a noise-tolerance;
• g) comparing the noise-tolerance to the amplitude of the noise pulse;
• and
• h) fabricating the electrical device.

An electrical device designed by a process that includes a method of predicting whether a failure of an electrical device may occur if a receiver within the electrical device is subjected to a noise pulse, the receiver having a circuit type and a beta-ratio, the noise pulse having an amplitude and a width, the method comprising:

• a) locating an integrated circuit that drives the receiver, the integrated circuit that drives the receiver having a circuit type;
• b) locating an integrated circuit that is driven by the receiver, the integrated circuit that is driven by the receiver having a circuit type and a capacitance;
• c) selecting, based at least in part upon the circuit type of the receiver, a plurality of noise-tolerance curves;
• d) selecting, based at least in part upon the capacitance of the integrated circuit that is driven by the receiver, the circuit type of the integrated circuit driven by the receiver, and the beta-ratio of the receiver, one of the plurality of noise-tolerance curves;
• e) selecting a noise-propagation constant based at least in part upon the circuit type of the integrated circuit that drives the receiver;
• f) determining, based upon the noise-tolerance curve and the width of the noise pulse, a noise-tolerance;
• g) comparing the noise-tolerance to the amplitude of the noise pulse;
• and
• h) fabricating the electrical device.