Dimension-measuring column and method for entering a command to switch the measure mode in such a column
AssigneeBrown & Sharpe TESA SA, a corporation of Switzerland
InventorsPascal Jordil, Charles-Henri Zufferey
Life of this patent
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Abstract
Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
Claims29
Method enabling a command to switch the measure mode to be entered in a dimension-measuring column provided with a probe tip,
- wherein said command to switch the measure mode is entered by only making use of the position of said probe tip.
Method enabling a command to switch the measure mode to be entered in a height-measuring column provided with a probe tip,
- said height-measuring column having a plurality of measure modes for measuring a plurality of different parameters of a piece,
- wherein said command to switch the measure mode is entered by pressing said probe tip against a piece to be measured,
- wherein said height measuring column remains in said measure mode as long as a sufficient pressing force is exerted by the probe tip against the piece to be measured.
Method for entering a command in a dimension-measuring column provided with a probe tip,
- said command enabling said measuring column to pass into a mode to search for the turn-back point of said piece to be measured,
- said command being entered only by pressing said probe tip against a piece to be measured during a time interval greater than a predetermined value.
Dimension-measuring column, comprising:
- a probe tip designed for being brought into contact with the piece to be measured,
- a displacement mechanism of said probe tip,
- a measuring and displaying system that allows the position of said probe tip to be determined and displayed, said measuring and displaying system being able to function according to several distinct modes,
- wherein at least one of said measure modes can be selected by acting on the position of the probe tip, without any other handling operating being necessary.
Computer data carrier comprising a command program for measuring and displaying system in a dimension-measuring column, said program enabling the position of the probe tip of said measuring column to be determined and displayed, said program being capable of making said measuring and displaying system function according to several distinct modes,
- wherein said program enables another of said measure modes to be selected by acting on the position of the probe tip.
Dependencies are inferred from the claim text.