Built-in self repair for an integrated circuit
AssigneeMicron Technology, Inc.
InventorDavid A. Zimlich
Life of this patent
Estimating the term…
Abstract
An integrated circuit, such as a memory device, includes a built-in repair circuit. The repair circuit includes an on-chip source that produces a programming signal of sufficient duration and magnitude to program a programmable element that normally isolates a secondary circuit, such as redundant circuitry, from the remainder of the circuits on the device. Once programmed, the redundant circuitry may take the place of failed circuitry, and thus repair the device.
Claims68
A method of manufacturing an integrated circuit comprising:
- providing a programmable element located on the integrated circuit, the programmable element being coupled to a redundant circuit used to repair the integrated circuit;
- and
- providing a source located on the integrated circuit and comprising a flyback pump, the source being operatively coupled to the programmable element and being adapted to develop a programming signal sufficient to program the programmable element to activate the redundant circuit.
A method of manufacturing an integrated circuit comprising:
- providing a test circuit located on the integrated circuit, the test circuit operable to functionally test a target circuit on the integrated circuit;
- providing a programmable element located on the integrated circuit, the programmable element being coupled to a redundant circuit used to repair the target circuit;
- and
- providing a repair circuit comprising a source located on the integrated circuit, the source being adapted to develop and deliver a programming signal sufficient to program the programmable element to activate the redundant circuit in response to the test circuit indicating that the target circuit is at least partially non-functional.
A method of manufacturing a system comprising:
- providing a processor;
- and
- providing a memory device operably coupled to the processor, the memory device comprising:
- a programmable element located on the memory device, the programmable element being coupled to a redundant memory cell used to repair the memory device;
- and
- a source located on the memory device and comprising a flyback pump, the source adapted to develop and deliver a programming signal sufficient to program the programmable element to activate the redundant memory cell in response to the processor indicating that a memory location of the memory device is non-functional.
A method of manufacturing an integrated circuit testing apparatus comprising:
- providing an integrated circuit;
- and
- providing a testing device configured to couple to the integrated circuit and to functionally test at least one target circuit of the integrated circuit, wherein the integrated circuit comprises:
- a programmable element located on the integrated circuit, the programmable element being coupled to redundant circuitry used to repair the integrated circuit;
- and
- a source located on the integrated circuit and comprising a flyback pump, the source adapted to be operatively coupled to the programmable element and to develop a programming signal sufficient to program the programmable element to activate the redundant circuitry in response to the testing device indicating that the target circuit is at least partially non-functional.
A method of repairing an integrated circuit comprising:
- identifying a defective portion of the integrated circuit;
- utilizing a flyback pump located on the integrated circuit to program a programmable element;
- and
- activating a redundant circuit located on the integrated circuit to functionally replace the defective portion in response to the programmable element being programmed.
A method of assembling an electronic device comprising installing an integrated circuit into an electrical device, wherein the integrated circuit comprises a flyback pump configured to activate a redundant circuit.
A method of repairing an integrated circuit comprising:
- transmitting a first signal in response to identifying a defective portion of the integrated circuit;
- transmitting a second signal from a source in response to the first signal, the source comprising:
- an inductance;
- a charging circuit coupled to the inductance to charge the inductance;
- and
- an output circuit coupled to the inductance to deliver the second signal from the inductance to the programmable element;
- and
- programming a programmable element in response to the second signal.
A method comprising operating an integrated circuit operably coupled to an electrical device, wherein the integrated circuit comprises a flyback pump configured to activate a redundant circuit.
Dependencies are inferred from the claim text.