Device testing apparatus

A device testing apparatus comprising:

• a tray for testing while pushing terminals of a plurality of electronic devices carried on the tray against contact portions of a test head;
• a pusher for pushing each of the plurality of electronic devices held on the tray in the direction of the contact portions;
• and
• a heat absorbing and radiating member provided at the pusher.

A device tester comprising:

• connection terminals to which an electronic device under test is detachably connected;
• a pusher for pushing the electronic device in the direction of the connection terminals so as to connect the electronic device to the connection terminals;
• a suction head having a vacuum suction bore for adhering the electric device by suction, the suction head being attached to the pusher;
• a cooling unit attached to the suction head for cooling the electronic device;
• a temperature sensor for measuring a temperature of the device;
• and
• a controller for controlling a cooling output of the cooling unit to cancel out heat generated by the electric device during tests and maintain the device constantly at a predetermined temperature on the basis of a temperature signal output by the temperature sensor.