Multiple-output arbitrary waveform generator and mixed lsi tester
AssigneeAdvantest Corporation
InventorHiroshi Nakagawa
Life of this patent
Estimating the term…
Abstract
There are disposed an output sequence control section, and output waveform data generation section for one system, and an analog waveform generation section includes four systems of ports 40, attenuators 43b for individually adjusting gains of analog test signals outputted via the respective ports, and digital/analog converters 45 for individually adjusting offset voltages of the analog test signals. Accordingly, when a plurality of LSIs to be tested are concurrently tested, the analog test signals optimized for each LSI to be tested are generated with a simple circuit configuration without complicating the circuit configuration of a performance board.
Claims3
A multiple-output arbitrary waveform generator comprising:
- an output waveform data generation section for generating an output waveform data signal for an LSI test;
- an output sequence control section for controlling the output waveform data generation section based on a test sequence specific to an LSI to be tested;
- and
- an analog waveform generation section for digital/analog-converting an output waveform data signal outputted from the output waveform data generation section to apply the signals to a plurality of LSIs to be tested,
- wherein the analog waveform generation section comprises:
- a gain adjustment section including a plurality of ports via which the analog test signals applied to the plurality of LSIs to be tested are individually outputted to individually adjust gains of the analog test signals outputted via the ports;
- and
- an offset adjustment section for individually adjusting offset voltages of the analog test signals.
A mixed LSI tester comprising:
- a multiple-output arbitrary waveform generator for generating an analog test signal based on a test sequence specific to a type of an LSI to be tested;
- and a performance board on which a plurality of LSIs to be tested are laid and in which the analog test signals are applied to the LSIs to be tested, wherein the arbitrary waveform generator comprises:
- an output waveform data generator for generating an output waveform data signal for an LSI test;
- an output sequence control section for controlling the output waveform data generation section based on the test sequence specific to the LSI to be tested;
- and
- an analog waveform generation section for digital/analog-converting the output waveform data signal outputted from the output waveform data generation section to generate the analog test signals to be applied to the plurality of LSIs to be tested, and
- the analog waveform generation section comprises:
- a gain adjustment section comprising a plurality of ports via which the analog test signals to be applied to the plurality of LSIs to be tested are individually outputted to individually adjust gains of the analog test signals outputted via the ports;
- and
- an offset adjustment section for individually adjusting offset voltages of the analog test signals.
Dependencies are inferred from the claim text.