Apparatus and method for determining the performance of micromachined or microelectromechanical devices (MEMS)
AssigneeInteruniversitair Microelektronica Centrum (IMEC)
InventorWillem Merlijn van Spengen
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AssigneeInteruniversitair Microelektronica Centrum (IMEC)
InventorWillem Merlijn van Spengen
Estimating the term…
An apparatus for determining the performances of at least one micromachined or microelectromechanical device (MEMS device) intended to carry a high frequency signal having an intended working frequency is disclosed. The MEMS device comprises a capacitive structure with at least one movable part, able to move with a frequency. The apparatus comprises a voltage signal source, at least one voltage divider circuit arranged between the capacitive structure and the voltage signal source, and a detection unit for detecting and measuring the voltage at the outlet of the voltage divider. The detection unit provides a combined voltage signal of an actuation voltage able to act on the moveable part of the capacitive structure with an actuation frequency and of a measurement voltage having a measurement frequency lower than the intended working frequency.
An apparatus for determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device) intended to carry a high frequency signal having an intended working frequency, the device comprising a capacitive structure with at least one movable part, the apparatus comprising:
A method of determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device), capable of carrying a high frequency signal having an intended working frequency, and comprising a capacitive structure with at least one movable part, comprising:
An apparatus for determining the performance of at least one micromachined or microelectromechanical systems device (MEMS device) intended to carry a high frequency signal having an intended working frequency, the device comprising a capacitive structure with at least one movable part, the apparatus comprising:
A test system for a micromachined or microelectromechanical systems (MEMS) device, comprising:
A test system for a micromachined or microelectromechanical systems (MEMS) device configured to transmit high frequency signals, comprising:
Dependencies are inferred from the claim text.