Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor
AssigneeFujitsu Limited
InventorsMakoto Haseyama, Shigeyuki Maruyama
Life of this patent
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AssigneeFujitsu Limited
InventorsMakoto Haseyama, Shigeyuki Maruyama
Estimating the term…
A contactor is used for testing an integrated circuit electronic component provided with a plurality of electrodes. The contactor includes an insulating base material provided with holes formed at positions corresponding to the electrodes, a first conductive layer having contacts which are plastically deformed portions of the first conductive layer, and reinforcement members provided on the contacts on a first surface of the contacts. The first surface of the contacts is facing towards the holes. The contacts are provided at positions corresponding to the electrodes for enabling an electrical connection to the electronic component and are protruded from the insulating base material.
A contactor used for testing an integrated circuit electronic component provided with a plurality of electrodes, said contactor comprising:
A method of manufacturing a contactor used for testing an integrated circuit electronic component provided with a plurality of electrodes, said method comprising the steps of:
A device for testing an integrated circuit electronic component provided with a plurality of electrodes using a contactor comprising:
A method of testing an integrated circuit electronic component provided with a plurality of electrodes using a contactor comprising:
Dependencies are inferred from the claim text.