Methods and apparatus for inspecting components
AssigneeGeneral Electric Company
InventorsAaron Henry King, James Marion Vau, Brett Wayne Byrnes
Life of this patent
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Abstract
A method for inspecting a component. The method includes coupling the component to a fixture such that the component is fixedly secured in position during machining of the component, and inspecting the component using an inspection tool while the component is coupled to the fixture.
Claims20
A method for inspecting a component, said method comprising:
- coupling the component to a fixture such that the component is fixedly secured in position during machining of the component;
- and
- inspecting the component using an inspection tool while the component is coupled to the fixture.
An inspection tool comprising a first probe having a probe body, a first probe tip coupled to said probe body, and a second probe tip coupled to said probe body, said first probe configured to inspect a component using said first and second probe tips.
An inspection tool in accordance with 7 further comprising a second probe configured to measure a length of the component.
An inspection apparatus for inspecting a component, said inspection apparatus comprising:
- a machining apparatus configured to machine the component;
- a fixture coupled to said machining apparatus and configured to couple to the component such that the component is fixedly secured in position during machining of the component;
- and
- an inspection tool coupled to at least one of said fixture and said machining apparatus, said inspection tool configured to inspect the component while the component is coupled to said fixture.
Dependencies are inferred from the claim text.