Performance monitor and method therefor
AssigneeFreescale Semiconductor, Inc.
InventorsCarlos J. Cabral, Jose M. Nunez
Life of this patent
Estimating the term…
Loading patent…
AssigneeFreescale Semiconductor, Inc.
InventorsCarlos J. Cabral, Jose M. Nunez
Estimating the term…
Embodiments of the present invention relate generally to a monitoring unit and method which counts a number of qualified clusters of a selected event type based on a size threshold, granularity threshold, and distance threshold time. In one embodiment, a qualified cluster is a cluster which meets both the size threshold and granularity threshold. In one embodiment, a qualified cluster is detected and counted by the cluster counter if it occurs at least the distance threshold time after a previous counted qualified cluster. For example, in one implementation, the performance monitor waits until a distance threshold time expires prior to detecting a next qualified cluster. Alternatively, all qualified clusters are detected where the cluster counter counts a qualified cluster only if it occurs at least the distance threshold time after a previous qualified cluster, regardless of whether it was counted by the cluster counter or not.
A performance monitor comprising:
A data processing system comprising:
A method for providing a count of a number of clusters of an event of an electronic system comprising:
Dependencies are inferred from the claim text.