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US 2004/0062301 A1Published application
Jitter measurement apparatus and jitter measurement method
OwnerTakahiro Yamaguchi, Masahiro Ishida +1inventors
InventorsTakahiro Yamaguchi, Masahiro Ishida, Mani Soma
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Abstract
A jitter measurement apparatus for measuring a jitter of a signal under measurement includes: a delay circuit which generates a delayed signal that is delayed from the signal under measurement by a predetermined delay time; and a phase detector which detects an instantaneous phase error between the signal under measurement and the delayed signal.
Claims17
A jitter measurement apparatus for measuring a jitter of a signal under measurement, comprising:
- a delay circuit operable to generate a delayed signal that is delayed from said signal under measurement by a predetermined delay time;
- and
- a phase detector operable to detect an instantaneous phase error between said signal under measurement and said delayed signal.
A jitter measurement method for measuring a jitter of a signal under measurement, comprising:
- generating a delayed signal that is delayed from said signal under measurement by a predetermined delay time;
- and
- detecting an instantaneous phase error between said signal under measurement and said delayed signal.
Dependencies are inferred from the claim text.