Method of recovering memory module, memory module and volatile memory

A volatile memory having a redundant memory cell which is accessed instead of a defective memory cell in which a defect is found, said volatile memory comprising:

• a defect information storage circuit for holding a defective row address and a defective column address transferred from the outside;
• a device information storage circuit for determining whether or not said defective device information relates to said volatile memory itself to hold the result of the determination;
• a row address comparator for comparing the defective row address stored in said defective information storage circuit with a row address supplied from the outside;
• a column address comparator for comparing the defective column address stored in said defective information storage circuit with a column address supplied from the outside;
• a redundant row decoder for activating a word line connected to said redundant memory cell when said defective row address matches said row address to enable an access to said redundant memory cell;
• and
• a redundant column decoder for activating a bit line connected to said redundant memory cell when said defective column address matches said column address to enable an access to said redundant memory cell.