Method and device for high-speed interferential microscopic imaging of an object

A device for interferential microscopic imaging of an object (9) comprising:

• a light source (1) which generates a luminous beam (2),
• a two-wave interferometer wherein a sine wave phase modulation of frequency f is introduced,
• an object (9) to be analysed, placed on one (7) of the arms of the two-wave interferometer,
• an optical system (8) focussing the beam (5), coming out of the beamspliter (3) on the object (9) to be analysed,
• a multichannel detector (15) which integrates the interference signal (S),
• characterised in that:
• a mechanical oscillator moves a set of elements of the interferometer thereby modulating the interference signal (S),
• the multichannel detector (8) operating at a frequency f′ so that f′=n f, n being an integer and greater than or equal to 2, and generating the integration of the interference signal (S) during fractions 1/n of a modulation period,
• a computer (19) enables to record the integrated interference signal obtained during each fraction of period 1/n and to calculate, then, the image of the object.