Test piece cutter and splitting method thereof
AssigneeAu Optronics Corporation
InventorsChiao-Chung Huang, Pei-Hsin Yu, Yuting Chuang
Life of this patent
Estimating the term…
Abstract
A precise cutting device for splitting a test piece. The device includes a microscope and a cutter. The microscope has a movable stage and a lens set. The stage supports the test piece. The lens set is adjustable to show the microstructure of the test piece. The cutter disposed under the stage of the microscope can pass through the opening of the stage to form notches on the surface of the test piece.
Claims12
A precise cutting device for splitting a test piece, comprising:
- a microscope, comprising:
- a support arm;
- s a stage having an opening and movably connected to the arm to support the test piece;
- and
- a lens set disposed on the top of the support arm, adjustable to show the microstructure of the test piece;
- a cutter disposed under the stage of the microscope and passing through the opening to form notches on the surface of the test piece.
A test piece splitting method for a precise cutting device with a microscope and a cutter, the microscope having a stage with an opening, a lens set and a first position adjuster, the cutter having a tip and disposed under the stage of the microscope, the test piece splitting method comprising the steps of:
- providing a test piece having a surface with a target point;
- fixing the test piece to the stage with the surface contacting the stage and the target point disposed within the range of the opening;
- adjusting the amplification of the lens set to show a distinct view of the target point;
- forming a first notch and a second notch on the surface, wherein the first notch and the second notch are aligned with the target point in a predetermined line, and the distance between the neighboring end points of the first notch and the second notch is a first interval;
- and
- splitting the test piece along the predetermined line.
Dependencies are inferred from the claim text.