Digital overcurrent test
AssigneeInternational Business Machines Corporation
InventorsJohn Edward Barth JR., Paul Christian Parries
Life of this patent
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Abstract
An integrated circuit having a charge pump is tested for excessive current draw by counting the number of times the charge pump cycles in a test interval, storing the result in a register that is used for another purpose during operation and comparing the result with a reference number representing acceptable leakage, thereby identifying latent defects that may become a cause of failure as well as short circuits.
Claims12
An integrated circuit having at least one circuit module connected to at least one charge pump, said charge pump containing measurement means for controlling operation of said charge pump in response to current leakage;
- resettable counter means for counting the number of times said charge pump turns on;
- means for resetting said counter means;
- and
- transfer means for transferring the sum of said counter means.
A method of testing an integrated circuit having at least one circuit module connected to at least one charge pump, said charge pump containing measurement means for controlling operation of said charge pump in response to current leakage, comprising the steps of;
- resetting a counter and counting the number of times said charge pump turns on in a test interval;
- holding the sum of said counter in a register;
- and
- comparing said sum with a threshold.
Dependencies are inferred from the claim text.