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AssigneeAffymetrix, Inc. a Corporation Organized under the laws of Delaware
InventorsDaniel M. Bartell, Xiaojun Di, Wei-Min Liu, Shantanu V. Kaushikkar
Estimating the term…
A system is described that associates grids with a probe array image based upon a positional placement of one or more control features, aligns the grids with one or more pixels based upon a metric value determined by one or more characteristics of the one or more pixels, and generates cell intensity values. The system may also associate grids with a probe array image based upon a positional placement of one or more control features, determine a ratio of pixel intensity values associated with areas of the grid and adjust the positional association of the grid based upon the determined ratio. The system may also associate grids with a probe array image based upon a positional placement of one or more control features and generate cell intensity values based upon weighted pixel intensity values associated with areas of the grid.
A system, comprising:
A method, comprising the acts of:
A system for probe array image analysis, comprising:
A method, comprising the acts of:
The method of claim 29, wherein:
A system for probe array image analysis, comprising:
A method for probe array image analysis, comprising:
Dependencies are inferred from the claim text.