Method for manufacturing identification codes of integrated circuits
AssigneeWinbond Electronics Corp.
InventorChien-Tsai Tseng
Life of this patent
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Abstract
The present invention reveals a method for manufacturing identification codes of integrated circuit. A number of the test machine, a serial number and a period of time ahead of loading a test pattern are written into an integrated circuit in the process of testing as the identification code. Thus, the identification codes of each integrated circuit of normal lot, re-testing lot and quality control lot is distinct to avoid the problems caused by repetitive identification codes.
Claims9
A method for manufacturing identification codes of integrated circuits, comprising the following steps of:
- making a first pattern which includes the number of a test machine for testing the integrated circuits and a period of time ahead of loading a test pattern into the test machine, wherein the test pattern is used to test functions of the integrated circuits;
- making a second pattern which includes serial numbers of the integrated circuits and stored addresses of the serial numbers;
- extracting the first pattern by the test machine;
- extracting a serial number of the second pattern by the test machine;
- and
- writing the extracted first pattern and the serial number of the integrated circuits into one of the integrated circuits as the identification code by the test machine.
A method for manufacturing identification codes of integrated IS circuits, comprising the following steps of:
- making at least one first pattern which includes the number of a test machine for testing the integrated circuits and a period of time ahead of loading a test pattern into the test machine, the name of each first pattern being related to the number of the test machine, wherein the test pattern is used to test functions of the integrated circuits;
- making a second pattern which includes serial numbers and the stored addresses of the serial numbers;
- extracting a serial number of the second pattern by the test machine;
- extracting the first pattern having related name by the test machine;
- and
- writing the extracted first pattern and the serial number of the integrated circuits into one of the integrated circuits as the identification code by the test machine.
Dependencies are inferred from the claim text.