Wafer level testing of optical components

An optical device, comprising:

• a waveguide extending from at least one optical component on the optical device;
• and
• a testing port including a facet positioned on the waveguide and a reflecting surface positioned so as to receive a light signal from over the optical device and reflect the light signal toward the facet such that the light signal is transmitted through the facet.

An optical device, comprising:

• a waveguide extending from at least one optical component on the optical device;
• and
• a testing port including a facet positioned on the waveguide and a reflecting surface positioned so as to receive a light signal transmitted through the facet and reflect the light signal toward a location over the optical device.

A method of testing an optical device, comprising:

• inserting a light signal into a waveguide on the optical device from over the optical device, the light signal being inserted into the waveguide before the optical device is separated from a wafer;
• and
• extracting at least a portion of the light signal from a second waveguide on the optical device such that the light signal travels from the optical device to a location above the optical device.

A method of operating an optical device, comprising:

• obtaining an optical device having a waveguide with a testing port, the testing port including a reflecting surface and a facet positioned on the waveguide;
• and
• reflecting a light signal off the reflecting surface such that the light signal is transmitted through the facet.

A method of operating an optical device, comprising:

• obtaining an optical device having a waveguide with a testing port, the testing port including a reflecting surface and a facet positioned on the waveguide;
• and
• reflecting a light signal transmitted through the facet off the reflecting surface such that the light signal travels from the optical device to a location over the optical device.