Device and method for reading non-volatile memories having at least one pseudo-parallel communication interface
AssigneeSTMicroelectronics S.r.l.
InventorsMaurizio Perroni, Salvatore Polizzi, Salvatore Poli
Life of this patent
Estimating the term…
Loading patent…
AssigneeSTMicroelectronics S.r.l.
InventorsMaurizio Perroni, Salvatore Polizzi, Salvatore Poli
Estimating the term…
The invention relates to a method for testing non-volatile memory devices that have at least one parallel communication interface, and a conventional matrix of non-volatile memory cells with respective reading, changing and erasing circuits, wherein during the testing procedure, a reading mode is entered for reading a memory location upon the rise edge of a control signal producing a corresponding ATD signal. Advantageously in the invention, a subsequent reading step is started also upon the fall edge of the control signal. In this way, at each cycle of the control signal two memory locations, instead of one as in the prior art, are read.
A method for testing non-volatile memory devices that have at least one parallel communication interface, and have a conventional matrix of non-volatile memory cells with respective reading, changing and erasing circuits, wherein during the testing procedure, a reading mode is entered for reading a memory location upon the rise edge of a control signal producing a corresponding ATD signal;
An electronic memory device, being monolithically integrated on a semiconductor and having at least one parallel interface and a matrix of non-volatile memory cells with respective row and column decoding circuits and circuits for reading, changing and erasing the contents of the memory cells, characterized in that it comprises a first generator block for generating impulsive row and column address signals, said first generator block receiving a control signal, and comprises a second generator block for generating an ATD signal, said second generator block receiving in turn said control signal and being operatively linked to both the rise and the fall edge of said control signal.
A method, comprising:
An integrated circuit, comprising:
An electronic system, comprising:
A method for testing a memory, comprising:
Dependencies are inferred from the claim text.