Method and apparatus for testing analog to digital converters
AssigneeInternational Business Machines Corporation
InventorsSteven J. Tanghe, Sharon L. Von Bruns
Life of this patent
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Abstract
A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.
Claims10
A method of testing an analog to digital converter, the method comprising the step of:
- testing for metastability errors in the analog to digital converter.
A method of testing an analog to digital converter and related circuitry for timing errors, the method comprising the steps of:
- providing a first waveform to the analog to digital converter;
- and
- providing a second waveform to the analog to digital converter, the second waveform having an amplitude, frequency or offset different from that of the first waveform.
An apparatus for testing an analog to digital converter and related circuitry for timing errors, the apparatus comprising:
- means for providing a first waveform to the analog to digital converter;
- and
- means for providing a second waveform to the analog to digital converter, the second waveform having an amplitude, frequency or offset different from that of the first waveform.
Dependencies are inferred from the claim text.