Method and apparatus for latent temperature control for a device under test

Temperature control apparatus, comprising:

• a thermal conditioning device adapted to transfer energy to or from a first object being conditioned;
• and
• a controller operatively coupled to said thermal conditioning device and having a control algorithm adapted to control the temperature of a first object using said thermal conditioning device according to the method comprising:
• controlling the temperature of said device to achieve a first temperature;
• observing at least one event associated with said first object after said device has achieved said first temperature;
• and
• subsequently controlling the temperature of said device based at least in part on said at least one event.

Temperature control apparatus, comprising:

• a conditioning device adapted to generate a range of temperatures;
• a first temperature probe adapted to generate first signals related to the temperature of a DUT;
• a second temperature probe adapted to generate second signals related to the temperature of at least a portion of said conditioning device;
• a controller, operatively coupled to said conditioning device and said probes and having an algorithm associated therewith, said algorithm being adapted to control the temperature of said conditioning device based at least in part on said first and second signals;
• wherein said controller is further adapted to control the temperature of said conditioning device by:
• (i) establishing a first temperature for said conditioning device;
• (ii) identifying at least one change in said DUT thereafter;
• (iii) identifying at least one event in said DUT thereafter;
• and
• (iv) adjusting the temperature of said conditioning device based at least in part on said first and second signals.