Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
AssigneeResearch Foundation of CUNY
InventorsRobert R. Alfano, Iosif Zeylikovich, Wubao Wang, Jamal Ali, Yury Budansky
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Abstract
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
Claims27
A system for non-destructively detecting material abnormalities beneath a coated surface, comprising:
- a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface;
- and
- a processing unit for producing an image from optical characteristics received from the MIR detection unit.
A method for non-destructively detecting material abnormalities beneath a coated surface, comprising the steps of:
- illuminating an area of the coated surface by a mid-infrared (MIR) light source;
- detecting light reflected from the illuminated area of the coated surface utilizing a photodetector;
- measuring optical characteristics of the reflected light;
- and
- producing a 2-D image from information received from the photodetector.
Dependencies are inferred from the claim text.