Probes and methods for testing electrical circuits
AssigneeAgilent Technologies, Inc.
InventorDavid Nelson Kimbley
Life of this patent
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Abstract
Probes and methods for testing electrical circuits are provided. One such probe includes a conductive socket, a conductive spring, and a housing that guides the conductive spring to the conductive socket to form an electrical connection between the spring and the socket. Once such method includes providing a conical and a spring and guiding the spring to the socket via the conical housing. The guiding step ensures that the spring contacts the socket during assembly and, therefore, ensures that a conductive path from the socket to the spring is provided. Methods and other probes are also provided.
Claims20
A probe for testing a circuit, said probe comprising:
- a conductive socket;
- a spring having a rounded portion electrically coupled to the conductive socket;
- and
- a conical housing coupled to the conductive socket, the conical housing having a tapering inner wall for guiding the spring to the socket.
A probe for testing a circuit, said probe comprising:
- a conductive socket;
- a conductive spring that contacts the conductive socket establishing an electrical path from the conductive socket to the conductive spring;
- and
- a conical housing having a uniformly tapering inner wall for guiding the conductive spring to the conductive socket.
A probe for testing a circuit, said probe comprising:
- a conductive socket adapted to receive a contact pin;
- a conductive spring;
- and
- means for guiding the spring to the socket to form an electrical connection between the spring and the socket.
A method for testing a circuit, said method comprising:
- providing a conical housing, the housing having a conductive socket;
- providing a spring;
- and
- guiding the spring to the socket via the conical housing.
Dependencies are inferred from the claim text.