Technique for optimizing decoupling capacitance subject to leakage power constraints
AssigneeSun Microsystems, Inc.
InventorsSudhakar Bobba, Pradeep Trivedi, Tyler Thorp
Life of this patent
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Abstract
A technique for optimizing decoupling capacitance on an integrated circuit while meeting leakage power constraints of the integrated circuit is provided. The technique involves the formulation of a linear optimization problem using physical characteristics and constraints of the integrated circuit, where a linear solution to the linear optimization problem yields an optimal decoupling capacitance presence on the integrated circuit.
Claims16
A method for assigning thin-oxide and thick-oxide capacitors on an integrated circuit, the integrated circuit having a capacitance requirement and a leakage power constraint, the method comprising:
- formulating a linear optimization problem, wherein formulating the linear optimization problem comprises:
- defining a first value as a value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors subject to the leakage power constraint;
- solving the linear optimization problem to determine a maximum value for the first value;
- and
- determining an optimal percentage of thin-oxide capacitance using the maximum value.
A computer system, comprising:
- a processor;
- a memory;
- and
- instructions, residing in the memory and executable by the processor, for:
- formulating a linear optimization problem, wherein formulating the linear optimization problem comprises:
- defining a first value as a value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors subject to the leakage power constraint;
- solving the linear optimization problem to determine a maximum value for the first value;
- and
- determining an optimal percentage of thin-oxide capacitance using the maximum value.
A computer-readable medium having recorded therein instructions executable by processing, the instructions for:
- formulating a linear optimization problem, wherein formulating the linear optimization problem comprises:
- defining a first value as a value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors subject to the leakage power constraint;
- and
- determining an optimal percentage of thin-oxide capacitance dependent on a maximization of the first value.
The computer system of claim 15, wherein the determination of the maximum value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors is dependent on areas of the plurality of regions.
A method for assigning thin-oxide and thick-oxide capacitors on an integrated circuit, the integrated circuit having a capacitance requirement and a leakage power constraint, the method comprising:
- step for formulating a linear optimization problem, wherein the step for formulating the linear optimization problem comprises:
- defining a first value as a value of capacitance that is obtained by replacing the thick-oxide capacitors with the thin-oxide capacitors subject to the leakage power constraint;
- step for solving the linear optimization problem to determine a maximum value for the first value;
- and
- step for determining an optimal percentage of thin-oxide capacitance using the maximum value.
Dependencies are inferred from the claim text.