Method and apparatus for generating electronic test and data structure
AssigneeAgilent Technologies, Inc.
InventorChristopher K. Sutton
Life of this patent
Estimating the term…
Loading patent…
AssigneeAgilent Technologies, Inc.
InventorChristopher K. Sutton
Estimating the term…
A hierarchical test executive system comprising and including Procedure, Test, Measurement and Datapoint levels. A Procedure is an ordered list of Tests; a Test is a group of Measurements in a Procedure that share the same test algorithm, and thus the same software code; a Measurement is a configuration or setup for a Test, and provides parameters to a Test; and a Datapoint is a subset of a Measurement containing additional parameters that select a result when one Measurement generates multiple results. When initiated, the test executive system presents a list of models and the user selects a model to be tested. The program then uploads the test software corresponding to the selected model and presents a list and descriptions of Procedures to the user. The user selects one of the Procedures, and the program retrieves the selected procedure from the test software and expands it into Tests, Measurements and Datapoints as determined by the Procedure. The test executive system then loops through the Tests, Measurements and Datapoints, generating the results and a corresponding data structure on the fly.
A method of operating a test executive system for electronically testing a device under test (DUT) that is separate and distinct from said test executive system, said method comprising:
A test executive system for testing a device under test (DUT) that is separate and distinct from the test executive system, said system comprising:
A product that provides a test executive system for controlling tests upon a device under test (DUT) that is distinct and separate from said test executive system, said product comprising:
Dependencies are inferred from the claim text.