Loading patent…
AssigneeTDK Corporation
InventorsKoji Mishima, Masaki Aoshima, Hiroyasu Inoue, Hideki Hirata, Hajime Utsunomiya
Estimating the term…
An optical recording medium includes a substrate, a first recording layer formed on the substrate and containing an element selected from the group consisting of Si, Ge, C, Sn, Zn and Cu as a primary component, and a second recording layer located in the vicinity of the first recording layer and containing Al as a primary component, the optical recording medium being constituted to be irradiated by a laser beam projected onto the side opposite from the substrate and the total thickness of the first recording layer and the second recording layer being equal to or thinner than 40 nm. According to the thus constituted optical recording medium, it is possible to decrease a noise level and improve a C/N ratio in a reproduced signal.
An optical recording medium comprising a substrate, a first recording layer formed on the substrate and containing an element selected from the group consisting of Si, Ge, C, Sn, Zn and Cu as a primary component, and a second recording layer located in the vicinity of the first recording layer and containing Al as a primary component, the optical recording medium being constituted to be irradiated by a laser beam projected onto the side opposite from the substrate and the total thickness of the first recording layer and the second recording layer being equal to or thinner than 40 nm.
A method for optically recording data comprising a step of projecting a laser beam of predetermined power onto the side opposite from a substrate of an optical recording medium comprising the substrate, a first recording layer formed on the substrate and containing an element selected from the group consisting of Si, Ge, C, Sn, Zn and Cu as a primary component, and a second recording layer located in the vicinity of the first recording layer and containing Al as a primary component, the optical recording medium being constituted to be irradiated by a laser beam projected onto the side opposite from the substrate and the total thickness of the first recording layer and the second recording layer being equal to or thinner than 40 nm.
Dependencies are inferred from the claim text.