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AssigneeSharp Kabushiki Kaisha
InventorsHideaki Sakaguchi, Masami Mori
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A testing device for a semiconductor integrated circuit of the present invention includes a differential amplifier array module and tester which determine whether an output voltage of a liquid crystal driver LSI is at a proper level and an expected value voltage generator which generates an expected value voltage in accordance with expected value data to output it to the differential amplifier array module. The expected value voltage generator produces expected value data by interpolation in accordance with incoming expected value data fewer in number than the expected value voltage to be generated, so as to be equal in number to the expected value voltage. This makes it possible to carry out an extremely short time and highly accurate test for output voltages of a device under test (liquid crystal driver LSI).
A reference voltage generating device for generating a reference voltage in accordance with incoming reference data,
A semiconductor integrated circuit containing a reference voltage generating device for generating a reference voltage in accordance with incoming reference data,
A testing device for a semiconductor integrated circuit, which determines whether an output voltage of the semiconductor integrated circuit is at a proper level by comparison with a reference voltage separately generated,
A testing method for a semiconductor integrated circuit, which determines whether an output voltage of the semiconductor integrated circuit is at a proper level by comparison with a reference voltage separately generated,
Dependencies are inferred from the claim text.