Scanning apparatus

An apparatus, comprising:

• a first reflective surface rotatable about a first axis to direct first radiation provided at least along a first axis off the first axis to a second axis along which the first radiation impinges on a sample responsive to first radiation;
• and
• a second reflective surface configured to direct second radiation emitted from the sample in response to the first radiation toward a detector oriented such that, when present, at least some second radiation impinges on the detector in a direction having a significant vector component parallel to the first axis.

A method, comprising:

• reflecting first radiation from a first surface, the first radiation provided along at least a portion of a first axis and reflected off of the first axis to impinge on a sample responsive to the first radiation;
• and
• reflecting second radiation from a second surface, the second radiation emitted from the sample in response to the first radiation and reflected directly from the sample by the second surface such that the second radiation travels substantially through air.

A method, comprising acts of:

• reflecting first radiation from a first surface, the first radiation provided along at least a portion of a first axis and reflected off the first axis by the first surface to a second axis along which the first radiation impinges on a sample responsive to the first radiation;
• and
• reflecting second radiation from a second surface, the second radiation emitted from the sample in response to the first radiation and reflected by the second surface towards a detector oriented such that at least some of the second radiation impinges on the detector in a direction having a significant vector component parallel to the first axis.