Electrochemical method for direct organic additives analysis in copper baths
AssigneeApplied Materials, Inc.
InventorsNicolay Kovarsky, Zhi-Wen Sun
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AssigneeApplied Materials, Inc.
InventorsNicolay Kovarsky, Zhi-Wen Sun
Estimating the term…
A voltammetric method for measuring the concentration of additives in a plating solution. The method generally includes providing the plating solution, including an unknown concentration of an additive to be measured, cycling an inert working electrode potential to alternately deposit and strip metal from the working electrode surface in the plating solution, wherein the metal deposition step includes a constant voltage plateau at a plateau potential sufficient to eliminate the interference of additives in the plating solution other than the additive to be measured. The method further includes determining a profile of the anodic current resulting from the applied working electrode potential as a function of time and determining a stripping peak area. The method may further include determining the concentration of the additive to be measured by the ratio of the stripping peak area from the profile to a stripping peak area of a base solution not including the additive to be measured.
A voltammetric method for measuring the concentration of additives in a plating solution, comprising:
A voltammetric method for measuring the concentration of an accelerator in a plating solution, comprising:
A voltammetric method for directly measuring the concentration of additives in a plating solution, comprising:
A voltammetric method for directly measuring the concentration of an accelerator in a plating solution, comprising:
A voltammetric method for measuring the concentration of an accelerator in a copper plating solution, comprising:
Dependencies are inferred from the claim text.