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US 2003/0200044 A1Published application
Systems and methods for tagging measurement values
AssigneeAgilent Technologies, Inc.
InventorsMichael T. McTigue, Allen Montijo
Life of this patent
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Abstract
Systems and methods for measuring a characteristic of an analog signal are provided. A system for measuring a characteristic of an analog signal includes an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value, and logic that is configured to associate a data tag with the data value.
Claims29
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value.
1 more element
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value.
A measurement and testing instrument (MTI) comprising:
- an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value that measures a characteristic of the analog signal;
- and
- logic that is configured to associate a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value.
Dependencies are inferred from the claim text.