Automatic electroencephalogram analysis apparatus and method
AssigneeFuji Xerox Co., Ltd.
InventorsYukihiro Tsuboshita, Isao Yamaguchi, Kazuhisa Ichikawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeFuji Xerox Co., Ltd.
InventorsYukihiro Tsuboshita, Isao Yamaguchi, Kazuhisa Ichikawa
Estimating the term…
Discrimination-target electroencephalographic data input from a discrimination-target electroencephalographic data input portion is converted into feature parameters on a phase space and feature parameters on a frequency space by a feature parameter extracting portion. By use of feature parameters generated likewise from a reference learning electroencephalographic data set input from a reference learning electroencephalographic data set input portion, a reference data space calculating portion calculates a mean, a variance, and an inverse matrix of a correlation matrix of the reference learning electroencephalographic data set. These are used as a reference data space. A Mahalanobis distance calculating portion obtains a Mahalanobis distance from the mean, the variance, and the inverse matrix of the correlation matrix of the reference learning electroencephalographic data set calculated as a reference data space, and the feature parameters calculated from the discrimination-target electroencephalographic data. A judgment portion judges normality/abnormality of the discrimination-target electroencephalogram according to the Mahalanobis distance.
An automatic electroencephalogram analysis apparatus comprising:
An automatic electroencephalogram analysis apparatus comprising:
An automatic electroencephalogram analysis apparatus comprising:
An automatic electroencephalogramanalysis method comprising:
A computer-readable recording medium recording an automatic electroencephalogram analysis computer program for making a computer execute a process comprising:
Dependencies are inferred from the claim text.