US 2003/0199208 A1 · SURFACE MOUNT PROBE POINT SOCKET AND SYSTEM

Abstract

A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circuit trace. The socket has a height and diameter for supporting a measurement probe in the housing while adding minimal inductance and capacitance to the measurement probe. A probe point contact is disposed in the bore of the socket for receiving a probe point disposed in the end of the measurement probe to secure the probe in the housing. Two surface mount probe point sockets may be joined together with an alignment gage and attached to adjacent circuit traces to produce a surface mount probe point socket system for differential measurement probes.

Claims12

Dependent claims

A surface mount probe point socket attachable on a circuit trace of a substrate for receiving a probe point of a high frequency measurement probe comprising:

an electrically conductive housing having a base and socket with the socket extending from the base and having a bore enclosed by an exterior wall and having a height and diameter that supports the measurement probe in the housing while adding minimal capacitance to the measurement probe, and the base having a length and width sufficient for attaching the housing to the circuit trace while adding minimal inductance to the circuit trace and the socket;
and
a probe point contact disposed in the bore of the socket receiving the probe point to secure the measurement probe in the housing.

A surface mount probe point socket system attachable on circuit traces of a substrate for receiving probe points of a high frequency differential measurement probe comprising:

first and second electrically conductive housings with each housing having a base and socket with the socket extending from the base and having a bore enclosed by an exterior wall and having a height and diameter that supports the measurement probe in the housing while adding minimal capacitance to the measurement probe, and the base having a length and width sufficient for attaching the housing to the circuit trace while adding minimal inductance and capacitance to the circuit trace and the socket;
first and second probe point contacts with each respective contact being disposed in the bore of one of the sockets for receiving one of the probe points to secure the differential measurement probe in the housing;
and
a non-conductive alignment gage having first and second apertures formed therein with each aperture receiving one of the sockets of the housing for positioning the housing on the adjacent circuit traces.

1 more element

Dependencies are inferred from the claim text.

Surface mount probe point socket and system

Life of this patent

Surface mount probe point socket and system

Life of this patent

Abstract

Claims12