Electrostatic chucking stage and substrate processing apparatus
AssigneeCanon Anelva Corporation
InventorsYasumi Sago, Kazuaki Kaneko, Takuji Okada, Masayoshi Ikeda
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AssigneeCanon Anelva Corporation
InventorsYasumi Sago, Kazuaki Kaneko, Takuji Okada, Masayoshi Ikeda
Estimating the term…
This application discloses the structure of an ESC stage where a chucking electrode is sandwiched by a moderation layer and a covering layer. The moderation layer and the covering layer have the thermal expansion coefficients between the dielectric plate and the chucking electrode. This application also discloses optimum total thickness of the ESC stage, optimum volume ratio of composite which the moderation layer is made of, and an optimum range of the thermal expansion coefficient of the composite. This application further discloses a substrate processing apparatus for carrying out a process onto a substrate as the substrate is maintained at a temperature higher than room temperature, comprising the electrostatic chucking stage for holding the substrate during the process.
An electrostatic chucking stage for electro-statically chucking an object, comprising:
Dependencies are inferred from the claim text.