Small particle analysis by laser induced incandescence
OwnerDavid R. Snelling, Gregory J. Smallwood +2inventors
InventorsDavid R. Snelling, Gregory J. Smallwood, Omer L. Gulder, Fengshan Liu
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OwnerDavid R. Snelling, Gregory J. Smallwood +2inventors
InventorsDavid R. Snelling, Gregory J. Smallwood, Omer L. Gulder, Fengshan Liu
Estimating the term…
The laser-induced incandescence (LII) to analyze characteristics of submicron sized particles is described. LII is recognized as a good tool for determining the characteristics of small particles in a gas, e.g., volume fraction, particle size, and specific surface area. It uses the fact that transient cooling is dependent on the specific surface area of the particle, which is related to diameter of the particle. In LII, particles are heated by a pulsed laser light beam to a temperature where incandescence from the particles can be distinguished from ambient light. The surface temperature of particles and their volume fraction governs the incandescence. The temperature decay is proportional to the primary particle size. The invention uses an optical arrangement that ensures a near-uniform laser energy distribution spatial profile. The invention also uses a low fluence laser beam pulse to avoid evaporation of particles. Without significant evaporation and with a uniform energy profile, accurate and precise measurements can be conducted more easily and reliably.
A method of analyzing submicron sized particles in a defined volume of gas, comprising steps of:
A method of analyzing submicron sized particles in a defined volume of gas, comprising steps of:
An apparatus for analyzing submicron sized particles in a defined volume of gas by laser induced incandescence, comprising:
An apparatus for analyzing submicron sized particles in a defined volume of gas by laser induced incandescence comprising:
Dependencies are inferred from the claim text.