Atom absorption spectroscopy method and atom absorption spectrometer
AssigneePerkinElmer Singapore PTE Ltd.
InventorBernhard H. Radziuk
Life of this patent
Estimating the term…
Loading patent…
AssigneePerkinElmer Singapore PTE Ltd.
InventorBernhard H. Radziuk
Estimating the term…
Atom absorption spectroscopy method generates at least one first beam of monochromatic radiation at a certain wavelength. Radiation is separated into a test beam and a reference beam, and only the test beam is led through a test area. Subsequently, both beams pass through a slot system into a monochromator, and after their spectral breakdown, reach a detector system. In order to improve such atom absorption spectroscopy method in a way that allows the test beam and the reference beam as well as their spectra to be guided close to, or adjacent to one other onto the detector system, and, at the same time enables a simple and easy adaptation of the spectrometer's effective spectral range to a monochromator's characteristics, the test beam and the reference beam thus pass through different slots in the slot system and are projected onto essentially spatially separate areas of the detector system, with their spectra's broken-down.
Atom absorption spectroscopy method, which generates at least one beam (1), essentially consisting of monochromatic radiation at a certain wavelength, and which separates this radiation into a test beam (2) and a reference beam (3). According to this method, only the test beam is then led through a test area (4). Subsequently, both beams (2, 3) pass through a slot system (5) and a monochromator (6), their spectra is broken down, and they then are guided to a detector device (7). Furthermore, the method is characterized in that the test beam (2) and the reference beam (3) pass through separate slots (8, 9) of the slot system (5) and finally hit the detector system (7) in essentially spatially separated areas (10, 11), with their spectra broken down.
Atom absorption spectroscopy method based on one of the above claims and characterized in that the test and/or reference beams (2, 3) are temporarily interrupted before passing through the slot system (5).
Atom absorption spectroscopy method based on one of the above claims and characterized in that a second, non-monochromatic beam (14) is injected for purposes of background compensation, especially at certain intervals, at chronological intervals in relation to the first beam (1).
Atom absorption spectroscopy method based on one of the above claims and characterized in that the monochromator (6) generates a two-dimensional spectra.
Atom absorption spectrometer (15) with at least one radiation source (12, 13) for the generation of a first, essentially monochromatic beam (1) of a certain wave length, a beam separator (16) for the separation of the first beam (1) into a test beam and a reference beam (2, 3);
Dependencies are inferred from the claim text.
Drawings are temporarily unavailable. Open the PDF at USPTO
From the US filing history. Foreign family members aren’t listed.
Backward citations are indexed for grants only.
Term end not estimated
This application claims priority of pending German Application No. 10207742.8 filed on Feb. 22, 2002.
The invention relates to atom absorption spectroscopy method and corresponding atom absorption spectrometer in accordance with the characteristics of the generic terms of the patent's claims 1 and 2.
A method like this, or alternatively, a corresponding device, is known from EP 0084391. Within this context, a radiation source, such as a hollow cathode lamp or a discharge lamp without electrodes, generates monochromatic radiation, which is separated by a beam separator into a test (sample) beam and a reference beam. The test beam is led through a test area in which a sample is atomized by means of a flame. The atomized sample absorbs part of the radiation, and the quantity of radiation absorbed represents a qualitative measure (unit of measurement) for the concentration of the element in the sample that is to be analyzed. Following the test area, the test beam is transferred through a series of optical elements and reunited with the reference beam. After that, both beams exit through the slot of a slot system and arrive in a monochromator. In the monochromator, a spectrum of the radiation is created. After leaving the monochromator, the spectrally dissected radiation hits a detector system.
Based on the figures of the attached illustrations, the following explains an advantageous version of the invention:
FIG. 1 shows a view from above upon the sample version of atom absorption spectrometer based on the invention at issue;
FIG. 2 shows a slanted perspective from above onto a slot disc, and
FIG. 1 shows a view from above the sample version of atom absorption spectrometer 15 based on the invention. It features a test area 4, in which, for example, a flame 42 is located for the purpose of atomizing a sample which is to be analyzed. Additionally, the atom absorption spectrometer 15 contains a number of radiation sources: 12 and 13. Besides the two depicted radiation sources, additional radiation sources may exist. The radiation sources emit an essentially monochromatic primary radiation 39, which, depending on which radiation source (12 or 13) is employed, hits a deflection device 19. On the bottom side that faces the radiation sources 12 and 13, the deflection device features a number of optical deflection means, such as mirrors or prisms. These reflect the corresponding primary beam 39 into the direction of a beam separator 16, in the form of a first beam 1. The beam separator 16 separates the first beam 1 into a test beam 2 and a reference beam 3.
By means of a toroid or ring mirror 20, the test beam 2 is deflected into the direction of the test area 4 where it is focused in the area of the flame 42. Part of the test beam 2 is absorbed within the flame 42, and the test beam with its now weakened intensity leaves the test area 4 and is reflected and focused through another toroid or ring mirror 23 into the direction of a flat mirror 25.
The flat mirror 25 is mounted on a clamping device 43 in a flexible manner. The flat mirror 25 deflects the test beam 2 in the direction of a slot system 5. After passing through a slot in slot system 5, the test beam hits a collimator 27. From there, the test beam is deflected into the direction of a monochromator 6, which consists of an Echelle grid 32 and a dispersion prism 33. The dispersion prism 33 is mounted behind the Echelle grid 32 and features, on the side facing away from the Echelle grid 32, a prism mirror 36. The latter can be adjusted by means of an adjustment device 37.