Photomask and method of manufacturing the same
AssigneeNone recorded
InventorSatoshi Aoyama
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AssigneeNone recorded
InventorSatoshi Aoyama
Estimating the term…
There is described a photomask having a substrate having a pattern formed thereon, a pellicle film which opposes a surface of the substrate and is stretched while remaining spaced a predetermined interval away from the substrate, and a frame which retains the pellicle film and closes a space between the pellicle film and the photomask substrate. The frame has an opening, and the opening is provided with a cover section capable of closing the opening. The pellicle film is affixed to the substrate of the frame in an inactive gas, and the internal space of the photomask is sealed with the cover section.
A photomask comprising:
Dependencies are inferred from the claim text.
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No related US applications are recorded in the indexed filing history.
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Apparatus or arrangements for taking photographs or for projecting or viewing them
Term end not estimated
1. Field of the Invention
The invention relates to a photomask. More specifically, the invention relates to the structure of a photomask on which a transfer pattern to be used for exposure is formed.
2. Background Art
FIG. 1 is a schematic cross-sectional view showing a photomask according to a first embodiment of the invention;
FIG. 2 is an enlarged schematic cross-sectional view showing an area of the photomask shown in FIG. 1 in which a filter is provided;
FIGS. 3A and 3B are schematic cross-sectional views of an area of the photomask shown in FIG. 1 in which a pressure regulation film is provided;
Embodiments of the invention will be described hereinbelow by reference to the accompanying drawings. Throughout the drawings, like or corresponding elements are assigned identical reference numerals, and their repeated explanations are simplified or omitted.
First Embodiment
FIG. 1 is a schematic cross-sectional view showing a photomask 100 according to a first embodiment of the invention. FIG. 2 is an enlarged schematic cross-sectional view showing an area of the photomask 100 shown in FIG. 1 in which a filter is provided. FIGS. 3A and 3B are schematic cross-sectional views of an area of the photomask 100 shown in FIG. 1 in which a pressure regulation film is provided. FIG. 3A shows a case where the pressure of internal space of the photomask 100 is high, and FIG. 3B shows a case where the pressure of internal space of the photomask 100 is low.