Parallel displacement/inclination measuring apparatus and antenna system
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorYukihiro Honma
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorYukihiro Honma
Estimating the term…
A laser pointer and an image sensor are employed as one measuring system, and two measuring systems are arranged such that a laser beam is irradiated in the opposite direction. One laser pointer and one image sensor are arranged on the measuring reference portion, and also One laser pointer and one image sensor are arranged on the measured portion. The parallel displacement ΔX and the inclination θ of the measured portion are calculated separately based on measured results obtained by these two measuring systems.
A parallel displacement/inclination measuring apparatus, comprising:
An antenna system comprising:
An antenna system comprising:
Dependencies are inferred from the claim text.
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1. Field of the Invention
The present invention relates to a measuring apparatus for measuring relative parallel displacement/inclination of the measured portion to the measuring reference portion in the precision measuring technology field, and an antenna system equipped with this measuring apparatus to correct the pointing error.
2. Description of the Related Art
FIG. 1 is a configurative view showing an example of a parallel displacement/inclination measuring apparatus according to an embodiment 1 of the present invention.
FIG. 2 is a schematic view showing the principle of the parallel displacement/inclination measuring apparatus according to the embodiment 1 of the present invention.
FIG. 3 is a schematic view showing the principle of the parallel displacement/inclination measuring apparatus according to the embodiment 1 of the present invention.
(Embodiment 1)
A parallel displacement/inclination measuring apparatus according to an embodiment 1 of the present invention will be explained with reference to FIG. 1 hereunder. FIG. 1 is a configurative view showing an example of the parallel displacement/inclination measuring apparatus according to the embodiment 1. In FIG. 1, 10 is a measured portion whose displacement and inclination are measured, and 11 is a measuring reference portion serving as a measuring reference. Also, 12a and 12b are laser pointers serving as a marker, 13a and 13b are two-dimensional image sensors that pick up images of the laser pointers 12a and 12b, and 14a and 14b are image data that are output from the image sensor 13a and the image sensor 13b. Also, 15 is a position calculating portion that calculates a center of gravity of the laser beam emitted from the laser pointers 12a and 12b respectively. The image data 14a and 14b are input into center-of-gravity position calculating circuits 15a and 15b respectively, and their centers of gravity are calculated. Also, 16a and 16b are center-of-gravity data of the leaser beams, which are calculated by the center-of-gravity position calculating circuits 15a and 15b, and 17 is a displacement/inclination calculating portion that calculates the displacement and the inclination of the measured portion from the center-of-gravity data 16a and 16b.
Next, the measuring principle of the displacement and the inclination will be explained hereunder. In FIG. 2, 18a and 18b are images from the image sensors 13a and 13b. FIG. 2 shows the initial set state, FIG. 3 shows the state in which a parallel displacement ΔX is generated, and FIG. 4 shows the state in which a rotation θy is generated. The image sensor senses the positional displacement of the laser beam in the two-dimensional plane. In this case, the laser pointer and the image sensor, which are positioned vertically, are set as one measuring system, and then two measuring systems are arranged such that respective laser beams can be irradiated in the opposite directions. At this time, as shown in FIG. 1, one laser pointer and one image sensor are arranged in the measuring reference portion, and also another laser pointer and another image sensor are arranged in the measured portion. The parallel displacement ΔX and the inclination θ are calculated separately based on measured results by these two measuring systems.