Interface adapter for automatic test systems
AssigneeEagle Test Systems, Inc.
InventorJack Edward Weimer
Life of this patent
Estimating the term…
Abstract
A removable interface adapter includes a frame, a first set of contacts configured for connection to a first set of test head contacts in a test system, and a second set of contacts configured for connection to a test board having at least one device to be tested. The first and second adapter contacts are interconnected so that electronic devices placed in the test board can be tested by the test system. With this adapter, test boards made for one test system can be used on other test systems.
Claims15
A removable interface adapter for testing electrical devices in a test system having a test head, using a test board having a plurality of first electrical contacts in a first configuration, the test head having a plurality of second electrical contacts in a second configuration, the interface adapter comprising:
- a frame that can be secured to and removed from the test head,
- a first set of adapter contacts configured for connection to the first electrical contacts, and
- a second set of adapter contacts configured for connection to the second electrical connectors,
- the first and second adapter connectors being interconnected so that the devices in the test board can be tested by the test system.
Apparatus for testing electronic devices comprising:
- a test board that holds the electronic devices, the test board having a plurality of first electrical contacts arranged in a first array,
- a test head having a plurality of second electrical contacts arranged in a second array,
- testing circuits connected to the test head for testing the electrical devices, and
- a removable adapter having a first set of adapter contacts configured for connection to the first array, and a second set of adapter contacts configured for connection to the second array,
- the first and second adapter contacts being interconnected so that the devices in the test board can be tested by the testing circuits.
A method for testing a plurality of types of electronic devices comprising the steps of:
- obtaining one or more first test heads from a first source;
- obtaining a device under test (DUT) board for each of the types of devices to be tested on the first test heads;
- obtaining a second test head from a second source, the DUT boards obtained for the first test heads being incompatible with the second test head;
- obtaining a removable interface adapter that can be secured to the second test head, the DUT boards for the first test heads being compatible with the removable interface adapter;
- and
- testing devices using the second test head, the removable interface adapter, and the DUT boards obtained for use with the first test heads.
Dependencies are inferred from the claim text.