Nanotube, near-field light detecting apparatus and near-field light detecting method
AssigneeNEC Corporation
InventorYoshiyuki Miyamoto
Life of this patent
Estimating the term…
Abstract
A near-field light detecting apparatus providing a high spatial resolution comprises a near-field light sensor for converting near-field light from the surface of a sample into an electric signal, and a voltage source for applying a predetermined voltage to the near-field light sensor through wires. The near-field light sensor comprises a nanotube which has an insulating property in a predetermined area. Electronic excitation is induced by the near-field light in two areas separated by the insulating area to convert the near-field light into the electric signal.
Claims27
A nanotube for converting near-field light into an electric signal, comprising:
- an insulating area;
- and
- a first and a second area separated by said insulating area,
- said near-field light inducing electronic excitation in said first and second areas to convert said near-field light into said electric signal.
A near-field light detecting apparatus comprising:
- a nanotube having an insulating area and a first and a second area separated by said insulating area;
- a voltage source for applying a predetermined bias voltage to said nanotube;
- and
- detecting means for detecting a first current generated by the application of said predetermined bias voltage and flowing through said nanotube, and a second current generated by electronic excitation induced by external near-field light in said first and second areas, said second current flowing through said nanotube.
A near-field light detecting method using a nanotube having an insulating area and a first and a second area separated by said insulating area, said method comprising the steps of:
- applying a predetermined bias voltage between said first and second areas of said nanotube;
- measuring a first current generated by the application of said predetermined bias voltage and flowing through said nanotube;
- and
- measuring a second current generated by electronic excitation induced by near-field light under detection in said first and second areas, said second current flowing through said nanotube.
A state analyzing apparatus comprising:
- a nanotube having an insulating area and a first and a second area separated by said insulating area;
- a voltage source for applying a predetermined bias voltage to said nanotube;
- detecting means for detecting a first current generated by the application of said predetermined bias voltage and flowing through said nanotube, and a second current generated by electronic excitation induced in said first and second areas by near-field light produced on the surface of a sample, said second current flowing through said nanotube;
- and
- analyzing means for analyzing a state on the surface of said sample based on said first and second currents detected by said detecting means.
A scanning near-field optical microscope comprising:
- a nanotube having an insulating area and a first and a second area separated by said insulating area;
- a voltage source for applying a predetermined bias voltage to said nanotube;
- detecting means for detecting a first current generated by the application of said predetermined bias voltage and flowing through said nanotube, and a second current generated by electronic excitation induced in said first and second areas by near-field light produced on the surface of a sample, said second current flowing through said nanotube;
- a probe having said nanotube mounted at a leading end thereof;
- movement control means for scanning said probe in a predetermined direction while maintaining a constant distance between said nanotube and the surface of said sample;
- and
- image generating means for generating an image of said near-field light related to the surface of said sample based on said first and second currents detected by said detecting means.
Dependencies are inferred from the claim text.