Liquid material evaporation apparatus for semiconductor manufacturing
AssigneeSTEC, Inc.
InventorsHideaki Miyamoto, Wataru Nishida, Tetsuo Shimizu
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AssigneeSTEC, Inc.
InventorsHideaki Miyamoto, Wataru Nishida, Tetsuo Shimizu
Estimating the term…
A liquid material evaporation apparatus including a mixing chamber, a flow control unit, a first flow passage for introducing a liquid material, a second flow passage for introducing a carrier gas connected to the mixing chamber through a first nozzle, the first nozzle inhibiting backflow from the mixing chamber into the second flow passage. A third flow passage for discharging evaporated mixed gas is connected to the mixing chamber through a second nozzle, the mixed liquid material and carrier gas being forced through the second nozzle by the flow control unit, the mixed liquid material and carrier gas depressurizing after passing through the second nozzle to evaporate into a mixed gas in the third flow passage. Heat is applied to the mixing chamber and the second and third flow passages to enhance mixing in the mixing chamber and to avoid condensation in the third flow passage.
A liquid material evaporation apparatus, comprising:
A liquid material evaporation apparatus, comprising:
Dependencies are inferred from the claim text.
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Boiling; Boiling apparatus for physical or chemical purposes ; Evaporation in general: evaporation for physical or chemical purposes; Evaporation…
Evaporating: by spraying
Gas and liquid contact apparatus: vaporizers
Boiling
Term end not estimated
This application is based on an application number 2002-069111 filed in Japan, the content of which is hereby incorporated by reference.
1. Field of the Invention
The present invention relates to a liquid material evaporation apparatus for use in semiconductor manufacturing.
The exact nature of this invention will be readily apparent from consideration of the following detailed description in conjunction with the accompanying drawings, wherein:
FIG. 1 schematically illustrates one example of the entire structure of a liquid material evaporation apparatus, wherein (A) is a top view and (B) is a front view;
FIG. 2 is an enlarged longitudinal cross-sectional view schematically illustrating the structure of the main portion of the liquid material evaporation apparatus according to the present invention;
Details of the present invention are explained in reference to the attached drawings that are meant not to limit the disclosure, but rather to illustrate various features. FIGS. 1-4 illustrate one embodiment of the present invention. In reference to FIG. 1, the control valve 1 provides a liquid flow control function. The structure of the control valve 1 is explained referring to FIG. 2 to FIG. 4. The main body block 2 is in the shape of a rectangular parallelepiped constructed from a material with good heat conductivity and corrosion resistance, such as stainless steel. Three flow passages 3, 4, 5 are formed inside the main body block, and a gas-liquid mixing chamber 6 is formed in the upper surface 2a.
The flow passage 3 is for introducing the liquid material LM into a gas-liquid mixing chamber 6, and this liquid material introduction passage 3 is in the shape of an L character so that one end is opened to a front side surface 2b of the main body block 2 and the other end is opened to the gas-liquid mixing chamber 6 in an upper surface 2a of the main body block 2.
The flow passage 4 is for introducing a carrier gas CG into the gas-liquid mixing chamber 6, and this carrier gas introduction passage 4 is in the shape of a reverse-L character so that one end is opened to a left side surface 2c of the main body block 2 and the other end is opened to the gas-liquid mixing chamber 6. A nozzle 7 is formed between the end of the carrier gas introduction passage 4 and the gas-liquid mixing chamber 6, in close proximity to the mixing chamber. The term nozzle includes any narrowing of the conduit, but especially a narrow conduit that has a longer dimension along the direction of flow. The nozzle 7, also called a backflow prevention nozzle, prevents backflow of the liquid material LM into the carrier gas introduction passage 4.